Dr Sergey Yatsunenko

Chief Technology Officer in the Business and innovations team at CRIDO

Sergey takes the position of Chief Technology Officer in the Business and innovations team at CRIDO.  He is a specialist in the identification, creation and implementation of innovative product and process solutions and is an expert, enthusiast and practitioner in the field of pragmatic innovations based on the modern Theory of Inventive Problem Solving (TRIZ). As the only one in Poland and one of 127 people in the world, Sergey has a level 4 certificate of the International TRIZ Association (MA TRIZ). He is a member of the board of the International TRIZ Association and a member of the MA TRIZ Council on Expertise and Methodology.

Sergey is also an expert in intellectual property issues and patent strategies. He deals with the development and propagation of the Design for Patentability (DFP) method in Poland.  Sergey gained experience in innovation design working for many Polish and foreign companies. In his career, he has completed over a dozen consulting projects and conducted over 1,500 hours of workshops and training in contemporary TRIZ and innovation design.  Sergey holds a PhD degree in physics from the Institute of Physics of the Polish Academy of Sciences, which he was awarded in 2005. He also graduated from the National University of Dnepropetrovsk, where he studied as a radio-physicist. In his scientific career, he conducted research in the field of optical properties of nanoparticles and quantum dots as well as microwave and terahertz systems for applications in medicine, biology and measurement and research systems. In addition, he is an expert in the field of surface metrology with the use of confocal microscopy and in the field of testing metal-carbon composites obtained by electroplating.

Sergey is the author and co-author of 50 scientific publications (Hi-index – 13), co-author of 5 patents, creator and co-author of 2 textbooks on the methodology of modern TRIZ. In addition, Sergey is a certified Olympus specialist in topography and surface metrology.

Design for Patentability Institute

 

 

top
X